Browsing by Author "Miyahara, K."
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Publication Degradation of MOSFETs on SIMOX by irradiation
Journal article1999, Journal of Radioanalytical and Nuclear Chemistry, (239) 2, p.357-360Publication Effects of mechanical stress on polycrystalline-silicon resistors
Journal article2002, Thin Solid Films, (406) 1_2, p.195-199Publication Impact of high-energy particle irradiation on polycrystalline silicon films
Proceedings paper2001, GADEST 2001 - Proceedings of the 9th International Autumn Meeting Gettering and Defect Engineering in Semiconductor Technology;, p.471-476Publication Impact of induced lattice defects on performance degradation of AlGaAs/GaAs p-HEMTs
Journal article1999, Physica B, 274, p.1034-1036Publication Mechanical stress of the electrical performance of polycrystalline-silicon resistors
Journal article2001, Journal of Materials Research, (16) 9, p.2579-2582Publication Radiation damages of Si avalanche photodiodes by 1-MeV fast neutrons and 220-MEV carbon particles
Proceedings paper1998, Semiconductors for Room-Temperature Radiation Detector Applications II;, p.429-434Publication Radiation effect on metal-contaminated Si diodes
Journal article1999, Journal of the Korean Physical Society, 35, p.S84-S87Publication Radiation effects on metal contaminated Si diodes
Oral presentation1998, 4th International Conference on Electronic Materials - ICEM 98; 24-27 August 1998; Cheju, Korea.Publication Radiation source dependence of degradation in MOSFETs on SIMOX substrate
Proceedings paper1998, Semiconductors for Room-Temperature Radiation Detector Applications II;, p.387-392Publication Reliability of polycrystalline silicon thin film resistors
Journal article2001, Microelectronics Reliability, (41) 9_10, p.1341-1346Publication Reliability of polycrystalline silicon thin film resistors
Proceedings paper2001, ESREF - Proceedings of the 12th European Symposium Reliability of Electron Devices, Failure Physics and Analysis;, p.1341-1346