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Browsing by Author "Miyashita, Toshihiko"

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    Publication

    3D-carrier profiling and parasitic resistance analysis in vertically stacked gate-all-around Si nanowire CMOS transistors

    Eyben, Pierre  
    ;
    Ritzenthaler, Romain  
    ;
    De Keersgieter, An  
    ;
    Chiarella, Thomas  
    ;
    Veloso, Anabela  
    Proceedings paper
    2019, IEEE International Electron Devices Meeting - IEDM 2019, 7/12/2019, p.238-241

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