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    The effect of forming gas annealing on capacitance-voltage hysteresis in the high- $j/In0.53Ga0.47As metal-oxide-semiconductor system

    Lin, Jun
    ;
    Monaghan, Scott
    ;
    Cherkaoui, Karim
    ;
    Povey, Ian M.
    ;
    Sheehan, Brendan
    ;
    Franco, Jacopo  
    Proceedings paper
    2016, 19th Workshop on Dielectrics in Microelectronics - WoDiM, 27/06/2016

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