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Browsing by Author "Mourier, Y."

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    Investigations and physical modelling of saturation effects in lateral DMOS transistor architectures based on the concept of intrinsic drain voltage

    Anghel, C.
    ;
    Hefyene, N.
    ;
    Ionescu, A. M.
    ;
    Vermandel, Miguel
    ;
    Bakeroot, Benoit  
    ;
    Doutrloigne, J.
    Proceedings paper
    2001, Proceedings of the 31st European Solid-State Device Research Conference, 11/09/2001, p.399-402

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