Browsing by Author "Mouthaan, T."

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Early resistance change modelling in electromigration

Mouthaan, T.
;
Petrescu, Violeta
;
Schoenmaker, Wim
;
Groot, F.
;
Angelecu, S.
;
Niehof, J.
Proceedings paper
1995, 25th European Solid State Device Research Conference - ESSDERC, 25/09/1995, p.311-314
Mechanical stress evolution and the Blech length: 2D simulation of early electromigration effects

Petrescu, Violeta
;
Mouthaan, T.
;
Schoenmaker, Wim
;
Salm, C.
Proceedings paper
1998, Proceedings of the 9th European Symposium on Reliability of Electron Devices and Failure Physics - ESREF, 5/10/1998, p.1047-1050
Mechanical stress evolution and the Blech length: 2D simulation of early electromigration effects

Petrescu, Violeta
;
Mouthaan, T.
;
Schoenmaker, Wim
;
Salm, C.
Journal article
1998, Microelectronics Reliability, (38) 6_8, p.1047-1050
Numerical analysis of electromigration in thin film VLSI interconnections

Petrescu, Violeta
;
Mouthaan, T.
;
Schoenmaker, Wim
;
Angelescu, Serban
;
Vissarion, R.
;
Dima, G.
Proceedings paper
1995, 18th International Semiconductor Conference. CAS'95 Proceedings, 10/10/1995, p.327-30