Browsing by Author "Nagano, T."

Now showing 1 - 4 of 4

Degradation and their recovery behavior of irradiated GaAlAs LEDs

Ohyama, H.
;
Takakura, K.
;
Nagano, T.
;
Hanada, M.
;
Kuboyama, S.
;
Simoen, Eddy
;
Claeys, Cor
Proceedings paper
2008, Gettering and Defect Engineering in Semiconductor Technology XII, 14/10/2007, p.119-124
Effects of electron and proton radiation on embedded SiGe source/drain diodes

Ohyama, H.
;
Nagano, T.
;
Takakura, K.
;
Motoki, M.
;
Matsuo, M.
;
Nakamura, H.
;
Sawada, M.
;
Midorikawa, M.
Journal article
2008, Materials Science in Semiconductor Processing, (11) 5_6, p.310-313
Effects of electron irradiation on SiGe devices

Ohyama, Hidenori
;
Nagano, T.
;
Takakura, K.
;
Motoki, M.
;
Matsuo, K.
;
Nakamura, H.
;
Sawada, M.
Journal article
2010, Thin Solid Films, (518) 9, p.2517-2520
Radiation damage of Ge diodes and MOSFETs on Ge-on-Si substrates

Nakamura, H.
;
Nagano, T.
;
Sukizaki, H.
;
Sakamoto, K.
;
Takakura, K.
;
Ohyama, H.
;
Kuboyama, S.
Oral presentation
2008, 8th International Workshop on Radiation Effects on Semiconductor Devices for Space Applications