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Browsing by Author "Nakabayashi, M."

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    20-MeV alpha ray effects in AlGaAsP p-HEMTs

    Ohyama, Hidenori
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    Simoen, Eddy  
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    Claeys, Cor
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    Takami, Y.
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    Kobayashi, K.
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    Yoneoka, M.
    Proceedings paper
    2000, Proceedings of the 4th International Workshop on Radiation Effects on Semiconductor Devices for Space Applications, 11/10/2000, p.133-138
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    A model for the radiation degradation of polycrystalline silicon films

    Ohyama, H.
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    Nakabayashi, M.
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    Takakura, K.
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    Simoen, Eddy  
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    Takami, Y.
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    Claeys, Cor
    Oral presentation
    2002, RADECS Workshop
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    A study on radiation damage of IGBTs 2-MeV electrons at different temperatures

    Nakabayashi, M.
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    Ohyama, H.
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    Hanano, N.
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    Kamiya, T.
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    Hirao, T.
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    Simoen, Eddy  
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    Claeys, Cor
    Proceedings paper
    2004, Proceedings 7th European Conference on Radiation and its Effects on Components and Systems, 15/09/2003, p.433-437
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    A study on radiation damage of IGBTs by 2-MeV electrons at different irradiation temperatures

    Nakabayashi, M.
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    Ohyama, H.
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    Hanano, N.
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    Kamiya, T.
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    Hirao, T.
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    Takakura, K.
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    Simoen, Eddy  
    Journal article
    2004, Nuclear Instruments & Methods in Physics Research B, 219-220, p.676-679
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    Defect assessment of irradiated STI Diodes

    Ohyama, Hidenori
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    Hayama, Kiyoteru
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    Miura, T.
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    Simoen, Eddy  
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    Claeys, Cor
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    Poyai, Amporn
    Journal article
    2002, Nuclear Instruments & Methods in Physics Research B, (186) 1_4, p.424-428
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    Defect assessment of irradiated STI diodes

    Ohyama, Hidenori
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    Hayama, Kiyoteru
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    Miura, T.
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    Simoen, Eddy  
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    Claeys, Cor
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    Poyai, Amporn
    Oral presentation
    2001, Symposium B of the E-MRS Spring Meeting 2001: Defect Engineering of Advanced Semiconductor Devices; June 5-8, 2001; Strasbourg,
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    Degradation and recovery of AlGaAs/GaAs p-HEMT irradiated by high-energy particle

    Ohyama, Hidenori
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    Simoen, Eddy  
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    Kuroda, S.
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    Claeys, C.
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    Takami, Y.
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    Hakata, T.
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    Kobayashi, K.
    Journal article
    2001, Microelectronics Reliability, (41) 1, p.79-85
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    Effects of electron irradiation on IGBT devices

    Ohyama, H.
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    Takakura, K.
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    Nakabayashi, M.
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    Hirao, T.
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    Onoda, S.
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    Kamiya, T.
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    Simoen, Eddy  
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    Claeys, Cor
    Oral presentation
    2003, 16th International Conference on Ion Beam Analysis - IBA
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    Effects of electron irradiation on SiC Schottky diodes

    Ohyama, H.
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    Takakura, K.
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    Watanabe, T.
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    Nishiyama, K.
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    Nakabayashi, M.
    ;
    David, Marie-Laure
    Proceedings paper
    2004, Proceedings International Conference on Electrical Engineering, p.628-631
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    Effects of high temperature electron irradiation on trench-IGBT

    Nakabayashi, M.
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    Ohyama, H.
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    Hanano, N.
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    Simoen, Eddy  
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    Claeys, Cor
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    Takakura, K.
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    Iwata, T.
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    Kudou, T.
    Journal article
    2005, Journal of Materials Science. Materials in Electronics, (16) 7, p.463-467
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    Effects of irradiation induced lattice defects on standard trench and fine pattern trench IGBT characteristics

    Nakabayashi, M.
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    Ohyama, H.
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    Kaneko, T.
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    Hanano, K.
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    Rafi, J.M.
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    Simoen, Eddy  
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    Claeys, Cor
    Journal article
    2009, Physica B: Condensed Matter, (404) 23_24, p.4674-4677
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    Effects of mechanical stress on polycrystalline-silicon resistors

    Nakabayashi, M.
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    Ohyama, Hidenori
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    Simoen, Eddy  
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    Ikegami, M.
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    Claeys, Cor
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    Kobayashi, K.
    Journal article
    2002, Thin Solid Films, (406) 1_2, p.195-199
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    Electron irradiation of IGBTs

    Nakabayashi, M.
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    Iwata, T.
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    Ohyama, H.
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    Takakura, K.
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    Yoneoka, M.
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    Simoen, Eddy  
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    Claeys, Cor
    Oral presentation
    2004, International Conference Materials for Microelectronics and Nanoengineering
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    Impact of high-energy particle irradiation on polycrystalline silicon films

    Nakabayashi, M.
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    Ohyama, Hidenori
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    Simoen, Eddy  
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    Claeys, C.
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    Tanaka, K.
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    Kobayashi, K.
    Proceedings paper
    2001, GADEST 2001 - Proceedings of the 9th International Autumn Meeting Gettering and Defect Engineering in Semiconductor Technology;, p.471-476
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    Impact of induced lattice defects on performance degradation of AlGaAs/GaAs p-HEMTs

    Hakata, T.
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    Ohyama, Hidenori
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    Kuroda, S.
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    Simoen, Eddy  
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    Claeys, C.
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    Kudou, T.
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    Kobayashi, K.
    Journal article
    1999, Physica B, 274, p.1034-1036
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    Impact of neutron irradiation on optical performance of InGaAsP laser diodes

    Ohyama, Hidenori
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    Simoen, Eddy  
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    Claeys, Cor
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    Takami, Y.
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    Sunaga, H.
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    Yoneoka, M.
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    Nakabayashi, M.
    Journal article
    2000, Thin Solid Films, (364) 1_2, p.259-263
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    Influence of boron implantation dose on the mechanical stress in polycrystalline silicon films

    Nakabayashi, M.
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    Ikegami, M.
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    Ohyama, Hidenori
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    Kobauashi, K.
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    Yoneoka, M.
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    Simoen, Eddy  
    Proceedings paper
    2000, 3rd International Conference Materials for Microelectronics, 16/10/2000, p.85-88
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    Influence of mechanical stress on the electrical performance of polycrystalline-silicon resistors

    Nakabayashi, M.
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    Ohyama, Hidenori
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    Kobayashi, K.
    ;
    Yoneoka, M.
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    Simoen, Eddy  
    ;
    Claeys, C.
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    Takami, Y.
    Oral presentation
    2000, MRS Spring Meeting 2000. Symposium A:Amorphous and Heterogeneous Silicon Thin Films - 2000; 24-28 April 2000; San Francisco, Ca,
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    Model for the radiation degradation of polycrystalline silicon films

    Nakabayashi, M.
    ;
    Ohyama, H.
    ;
    Takakura, K.
    ;
    Simoen, Eddy  
    ;
    Claeys, Cor
    Journal article
    2003, IEEE Trans. Nuclear Science, (50) 6, p.2481-2485
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    Radiation damage in flash memory cells

    Claeys, Cor
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    Ohyama, Hidenori
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    Simoen, Eddy  
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    Nakabayashi, M.
    ;
    Kobayashi, K.
    Journal article
    2002, Nuclear Instruments & Methods in Physics Research B, (186) 1_4, p.392-400
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