Browsing by Author "Nakaei, T."
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Publication Calibrated wafer-level HBM measurements for quasi-static and transient device analysis
Proceedings paper2007, EOS/ESD Symposium Proceedings, 16/09/2007, p.89-94Publication On-wafer human metal model measurements for system-level ESD analysis
Meeting abstract2009-09, 31st Annual EOS/ESD Symposium, 30/08/2009, p.5B.4