Browsing by Author "Nakaei, Toshiyuki"
Now showing 1 - 2 of 2
- Results Per Page
- Sort Options
Publication On-wafer human metal model – system-level ESD stress on component level
Proceedings paper2008-10, RCJ ESD Symposium, 30/10/2008Publication Voltage overshoot study in 20V DeMOS-SCR devices
;Vashchenko, Vladislav ;Jansen, Philippe ;Scholz, Mirko ;Hopper, PeterSawada, MasanoriProceedings paper2007-09, EOS/ESD Symposium Proceedings, 16/09/2007, p.53-57