Browsing by Author "Nakaie, T."
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Publication ESD on-wafer characterization: Is TLP still the right measurement tool?
Journal article2009-10, IEEE Transactions on Instrumentation and Measurement, (58) 10, p.3418-3426Publication Low-power low-noise highly ESD robust LNA and VCO design using above IC inductors
Proceedings paper2005-09, Proceedings of the IEEE Custom Integrated Circuits Conference, 18/09/2005, p.492-495Publication RF ESD protection strategies - the design and performance trade-off challenges
Proceedings paper2005-09, Proceedings of the IEEE Custom Integrated Circuits Conference, 18/09/2005, p.489-496