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Browsing by Author "Nakamura, Shiho"

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    Characterization of Interface States in CVD Monolayer MoS2/Al2O3 MOS Capacitors via the Conductance Method

    Nakamura, Shiho  
    ;
    Lin, Zaoyang  
    ;
    Tsuruoka, Daiki
    ;
    Endo, Takahiko
    ;
    Yu, Xiao  
    ;
    Lee, Tsung-En  
    Journal article
    2026, IEEE ELECTRON DEVICE LETTERS, (47) 9, p.1720-1723

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