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Browsing by Author "Neimash, V."

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    A deep level study of high-temperature electron-irradiated n-type Cz silicon

    Simoen, Eddy  
    ;
    Claeys, Cor
    ;
    Neimash, V.
    ;
    Kraitchinskii, A.
    ;
    Kras'ko, M.
    ;
    Tischenko, V.
    ;
    Voitovych, V.
    Proceedings paper
    2004, Gettering and Defect Engineering in Semiconductor Technology - GADEST 2003, 21/09/2003, p.367-372
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    A deep level study of high-temperature electron-irradiated n-type Cz silicon

    Simoen, Eddy  
    ;
    Claeys, Cor
    ;
    Neimash, V.
    ;
    Kraitchinskii, A.
    ;
    Kras'ko, M.
    ;
    Tishenko, V.
    ;
    Voitovich, V.
    Oral presentation
    2003, Gettering and Defect Engineering in Semiconductor Technology - GADEST
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    Behavior of n-Si electrical parameters after a high-temperature 1 MeV electron irradiation

    Neimash, V.
    ;
    Kraitchinskii, A.
    ;
    Kras'ko, N.
    ;
    Voitovych, V.
    ;
    Simoen, Eddy  
    ;
    Claeys, Cor
    Oral presentation
    2002, 2nd International Conference on Materials and Coatings for Extreme Performances
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    Deep levels in high-temperature 1 MeV electron irradiated n-type czochralski silicon

    Simoen, Eddy  
    ;
    Rafi, Joan Marc
    ;
    Claeys, Cor
    ;
    Neimash, V.
    ;
    Kraitchinski, A.
    ;
    Kras'ko, M.
    ;
    Tischenko, V.
    Journal article
    2003, Japanese Journal of Applied Physics. Part 1: Regular Papers, (42) 3, p.7184-7188
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    DLTS studies of high-temperature electron irradiated Cz n-Si

    Neimash, V.
    ;
    Kras'ko, M.
    ;
    Kraitchinskii, A.
    ;
    Voytivych, V.
    ;
    Tishenko, V.
    ;
    Simoen, Eddy  
    Journal article
    2004, Physica Status Solidi A, (201) 3, p.509-516
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    Electrically active defects in irradiated n-Type Czochralski silicon doped with group IV impurities

    David, M.L.
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    Simoen, Eddy  
    ;
    Claeys, Cor
    ;
    Neimash, V.
    ;
    Kras'ko, M.
    ;
    Kraitchinski, A.
    ;
    Voytovych, V.
    Oral presentation
    2004, Workshop on Defects Relevant to Engineering Advanced Silicon-Based Devices
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    Electrically active defects in irradiated n-type Czochralski silicon doped with group IV impurities

    David, Marie-Laure
    ;
    Simoen, Eddy  
    ;
    Claeys, Cor
    ;
    Neimash, V.
    ;
    Kras'ko, M.
    ;
    Kraitchinskii, A.
    Journal article
    2005, Journal of Physics: Condensed Matter, (17) 22, p.S2255-S2266
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    High-temperature electron irradiation effects on the electrical parameters of n-type Cz silicon

    Neimash, V.
    ;
    Kraitchinskii, A.
    ;
    Kras'ko, N.
    ;
    Tischenko, V.
    ;
    Voitovych, V.
    ;
    Simoen, Eddy  
    ;
    Claeys, Cor
    Meeting abstract
    2002, Belgische Natuurkundige Vereniging / Société Belge de Physique: General Scientific Meeting, 5/06/2002, p.CM1-6
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    High-temperature electron-irradiation induced deep levels in n-type Cz silicon

    Simoen, Eddy  
    ;
    Claeys, Cor
    ;
    Neimash, V.
    ;
    Kraitchinskii, A.
    ;
    Kras'ko, M.
    ;
    Tischenko, V.
    ;
    Voitovych, V.
    Meeting abstract
    2003, International Scientific Meeting Belgian Physical Society, 27/05/2003, p.CM1-17
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    Impact of high-temperature electron irradiation on the electrical parameters of n-type CZ silicon

    Neimash, V.
    ;
    Kraitshinskii, A.
    ;
    Kras'ko, N.
    ;
    Tischenko, V.
    ;
    Voitovych, V.
    ;
    Simoen, Eddy  
    ;
    Claeys, Cor
    Proceedings paper
    2002, High Purity Silicon VII, 20/10/2002, p.336-346
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    On the effect of lead on irradiation induced defects in silicon

    David, M.L.
    ;
    Simoen, Eddy  
    ;
    Claeys, Cor
    ;
    Neimash, V.
    ;
    Kras'ko, M.
    ;
    Kraitchinskii, A.
    ;
    Voytovych, V.
    Proceedings paper
    2005, Gettering and Defect Engineering in Semiconductor Technology XI. Proceedings of the 11th International Autumn Meeting, 25/09/2005, p.373-378
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    Radiation-induced deep levels in lead and tin doped n-type czochralski silicon

    David, Marie-Laure
    ;
    Simoen, Eddy  
    ;
    Claeys, Cor
    ;
    Neimash, V.
    ;
    Kras'ko, M.
    ;
    Kraitchinskii, A.
    Proceedings paper
    2004, High Purity Silicon VIII, 3/10/2004, p.395-406

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