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Browsing by Author "Nellist, P.D."

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    Publication

    Atom column detection from STEM images using the maximum a posteriori probability rule

    Fatermans, J.
    ;
    den Dekker, A.J.
    ;
    O'Leary, C.M.
    ;
    Nellist, P.D.
    ;
    Van Aert, S.
    Meeting abstract
    2019, Microscopy Conference 2019, 1/09/2019

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