Browsing by Author "Nguyen, A. P. D."
Now showing 1 - 1 of 1
- Results Per Page
- Sort Options
Publication Experimental characterization of BTI defects
; ; ;Rott, Karina ;Cerbu, F.; ;Grasser, TiborMadia, O.Proceedings paper2013, SISPAD Satellite Workshop: Modelling of Reliability and Degradation of Nanoelectronic Devices, 3/09/2013, p.444-450