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Browsing by Author "Nishimura, A."

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    Radiation tolerance in HfSiON gate MOSFETs by high-energy Particles irradation

    Hayama, K.
    ;
    Takakura, K.
    ;
    Nishimura, A.
    ;
    Ohyama, H.
    ;
    Mercha, Abdelkarim  
    ;
    Simoen, Eddy  
    ;
    Claeys, Cor
    Oral presentation
    2005, 24th Electronic Materials Symposium - EMS-24

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