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Browsing by Author "Nishiyama, K."

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    Degradation behaviors for high temperature irradiated NPN Si transistors

    Ohyama, H.
    ;
    Takakura, K.
    ;
    Nishiyama, K.
    ;
    Simoen, Eddy  
    ;
    Claeys, Cor
    Proceedings paper
    2002, Proceedings of the 5th International Workshop on Radiation Effects on Semiconductor Devices for Space Applications, 9/10/2002, p.89-92
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    Effects of electron irradiation on SiC Schottky diodes

    Ohyama, H.
    ;
    Takakura, K.
    ;
    Watanabe, T.
    ;
    Nishiyama, K.
    ;
    Nakabayashi, M.
    ;
    David, Marie-Laure
    Proceedings paper
    2004, Proceedings International Conference on Electrical Engineering, p.628-631
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    Radiaton damage of SiC Schotttky diodes by electron irradiation

    Ohyama, H.
    ;
    Takakura, K.
    ;
    Watanabe, T.
    ;
    Nishiyama, K.
    ;
    Shigaki, K.
    ;
    Kudou, T.
    ;
    Nakabayashi, M.
    Journal article
    2005, Journal of Materials Science: Materials in Electronics, (6) 7, p.455-458

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