Browsing by Author "Ousten, Y."
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Publication Failure mechanisms and qualification testing of passive components
;Post, H.A. ;Letullier, P. ;Briolat, T. ;Humke, R. ;Schuhmann, R. ;Saarinen, K. ;Werner, W.Ousten, Y.Journal article2005, Microelectronics Reliability, (45) 9_11, p.1626-1632