Browsing by Author "Ozdemir, Yusuf Burak"
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Publication Nanoindentation based methodology to characterize the adhesion strength of dielectric bond interfaces
Proceedings paper2025, IEEE 75th Electronic Components and Technology Conference (ECTC), 2025-05-27, p.965-971Publication Physics-informed deep learning approach for nanoindentation-based thin film analysis
Journal article2025, MICROELECTRONICS RELIABILITY, 173, p.115875Publication Simulation-Driven Insights Into Nanoindentationbased Adhesion Strength Measurement of Wafer-to-Wafer Bonds
Proceedings paper2025, 26th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE), 2025-04-06