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Browsing by Author "Paccagnella,"

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    Publication

    Total-ionizing-dose effects and low-frequency noise in 16-nm InGaAs FinFETs with HfO2/Al2O3 dielectrics

    Bonaldo,
    ;
    Zhao,
    ;
    O Hara,
    ;
    Gorchichko,
    ;
    Zhang,
    ;
    Gerardin,
    ;
    Paccagnella,
    ;
    Waldron, Niamh  
    Journal article
    2020, IEEE Transactions on Nuclear Science, (67) 1, p.210-220

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