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Publication
Optical Degradation of 845 nm VCSELs With Different Oxide Apertures for Silicon Photonics
Zenari, Michele
;
Buffolo, Matteo
;
Perale, Filippo
;
De Santi, Carlo
;
Goyvaerts, Jeroen
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Journal article
2026,
IEEE JOURNAL OF SELECTED TOPICS IN QUANTUM ELECTRONICS,
(32) 6,
p.1-8