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Browsing by Author "Pichon, L."

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    Meyer-Neldel parameter as a figure of merit for quality of thin-film-transistor active layer?

    Pichon, L.
    ;
    Mercha, Abdelkarim  
    ;
    Routoure, J. M.
    ;
    Carin, R.
    ;
    Bonnaud, O.
    ;
    Mohammed-Brahim, T.
    Oral presentation
    2002, E-MRS Spring Meeting Symposium K: Thin Film Materials for Large-Area Electronics

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