Browsing by Author "Poleunis, C."
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Publication Fundamental aspects of Arn+ SIMS profiling of common organic semiconductors
Meeting abstract2013, 19th International Conference on Secondary Ion Mass Spectrometry, 29/09/2013Publication ToF-SIMS and XPS characterization of plasma etch residues on cobalt silicide surfaces
Proceedings paper1997, Secondary Ion Mass Spectrometry - SIMS X : Proceedings of the 10th International Conference, 2/10/1995, p.921-924