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    Publication

    Modeling the Performance and Reliability of Two-Dimensional Semiconductor Transistors

    Knobloch, T.
    ;
    Waldhoer, D.  
    ;
    Davoudi, M. R.
    ;
    Karl, A.
    ;
    Khakbaz, P.
    ;
    Matzinger, M.
    ;
    Zhang, Y.
    Proceedings paper
    2023, International Electron Devices Meeting (IEDM), 2023-12-09

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