Browsing by Author "Pouget, Vincent"
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Publication Different failure signatures of multiple TLP and HBM stresses in an ESD robust protection structure
;Guitard, Nicolas ;Essely, Fabien ;Tremouilles, David ;Bafleur, MariseNolhier, NicolasJournal article2005, Microelectronics Reliability, (45) 9_11, p.1415-1420