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Browsing by Author "Prewett, P. D."

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    Effects on IC quality of 5X reticle repair using FIB with stain reduction

    Prewett, P. D.
    ;
    Martin, B.
    ;
    Watson, J. G.
    ;
    Jonckheere, Rik  
    Proceedings paper
    1994, Integrated Circuit Metrology, Inspection and Process Control VIII, 28/02/1994, p.211-218
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    FIB repair of reticle defects with antistaining-effects on optical lithography from G-line to DUV

    Prewett, P. D.
    ;
    Martin, B.
    ;
    Watson, J. G.
    ;
    Eastwood, A. W.
    ;
    Jonckheere, Rik  
    Journal article
    1994, Microelectronic Engineering, 23, p.127-130

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