Browsing by Author "Qiao, Fengying"
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Publication A proper approach to characterize retention-after-cycling in 3D-Flash devices
Proceedings paper2013, International Conference on Microelectronics Test Structures - ICMTS, 25/03/2013, p.187-191Publication Reliability comparison of ISSG oxide and HTO as tunnel dielectric in 3-D–SONOS applications
Journal article2013, IEEE Electron Device Letters, (34) 5, p.620-622