Browsing by Author "Radhakrishnan, M.K."

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A new breakdown failure mechanism in HfO2 gate dielectrics

Ranjan, R.
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Pey, K.L.
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Tang, L.J.
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Tung, C.H.
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Groeseneken, Guido
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Radhakrishnan, M.K.
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Kaczer, Ben
Proceedings paper
2004, Proceedings IEEE International Reliability Physics Symposium - IRPS, 25/04/2004, p.347-352
ESD reliability challenges for RF/mixed signal design and processing

Mahadeva Iyer, Natarajan
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Radhakrishnan, M.K.
Proceedings paper
2003, Proceedings 16th Int. Conf. on VLSI Design concurrently with the 21nd Int. Conf. on Embedded Systems Design, 4/01/2003, p.20-21
Physical failure analysis to distinguish EOS and ESD failures

Tung, Chih Hang
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Cheng, Cheng Kou
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Radhakrishnan, M.K.
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Mahadeva Iyer, Natarajan
Proceedings paper
2002, Proceedings of the 9th International Symposium on the Physical and Failure Analysis of Integrated Circuits - IPFA, 8/07/2002, p.65-69