Browsing by Author "Raineri, Vito"
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Publication Carrier Distribution in Silicon Devices by Atomic Force Microscopy on Etched Surfaces
Journal article1994, Appl. Phys. Lett., 64, p.354-356Publication Carrier Profile Determination in Device Structures using AFM-Based Methods
Oral presentation1995, International Workshop on Semiconductor Characterization: Present Status and Needs; January 1995; Gaithersburg, USA.Publication On the determination of two-dimensional carrier distributions
Proceedings paper1995, 3rd Int. Workshop on the Measurement and Characterizaton of Ultra-Shallow Dopant Profiles in Semiconductors, 20/03/1995, p.41.1-41.19Publication On the determination of two-dimensional carrier distributions
Journal article1995, Nuclear Instruments and Methods in Physics Research B, (96) 1_2, p.123-32Publication On the Determination of Two-Dimensional Carrier Distributions
Oral presentation1994, Ion Implantation Technology Conference; June 13-16, 1994; Catania, Italy.Publication Titanium silicidation and secondary defect annihilation in ion beam processed SiGe layers
Publication Two-dimensional spreading resistance profiling: recent understandings and applications
Journal article1994, J. Vac. Sci. Technol. B, (12) 1, p.276-282