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Browsing by Author "Ramgopal Rao, V."

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    Understanding and optimization of hot-carrier reliability in germanium-on-silicon pMOSFETs

    Maji, D.
    ;
    Crupi, Felice
    ;
    Amat, E.
    ;
    Simoen, Eddy  
    ;
    De Jaeger, Brice  
    ;
    Brunco, David
    ;
    Manoj, C.R.
    Journal article
    2009, IEEE Transactions on Electron Devices, (56) 5, p.1063-1069

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