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Publication
Through silicon via to FinFET noise coupling in 3-D integrated circuits
Rouhi Najaf Abadi, Alireza
;
Guo, Wei
;
Sun, Xiao
;
Ben Ali, K.
;
Raskin, J.P
;
Rack, M.
;
Roda Neve, Cesar
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Proceedings paper
2015,
International Conference on IC Design and Technology - ICICDT,
1/06/2015,
p.1-4