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Browsing by Author "Rassamakin, J."

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    gamma-Irradiation hardness of short-channel NMOSFETS fabricated in a 0.5 μm SOI technology

    Claeys, Cor
    ;
    Simoen, Eddy  
    ;
    Efremov, A.
    ;
    Litovchenko, V. G.
    ;
    Evtukh, A.
    ;
    Kizjak, A.
    ;
    Rassamakin, J.
    Journal article
    2002, Nuclear Instruments & Methods in Physics Research B, (186) 1_4, p.429-434
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    Influence of gamma-radiation on short channel SOI-MOSFETs with thin SiO2 films

    Claeys, Cor
    ;
    Simoen, Eddy  
    ;
    Litovchenko, V.G.
    ;
    Evtukh, A.
    ;
    Efremov, A.
    ;
    Kizjak, A.
    ;
    Rassamakin, J.
    Proceedings paper
    2002, Progress in SOI Structures and Devices Operating at Extreme Conditions. Proceedings of the NATO Advanced Research Workshop, 15/10/2000, p.211-220
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    γ-irradiation hardness of short channel NMOSFETs fabricated in a 0.5 µm SOI technology

    Claeys, C.
    ;
    Simoen, Eddy  
    ;
    Efremov, A.
    ;
    Litovchenko, V. G.
    ;
    Evtuth, A.
    ;
    Kizjak, A.
    ;
    Rassamakin, J.
    Oral presentation
    2001, Symposium B of the E-MRS Spring Meeting 2001: Defect Engineering of Advanced Semiconductor Devices;

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