Repository logo Institutional repository
  • Communities & Collections
  • Browse
  • Site
Search repository
High contrast
  1. Home
  2. Browse by Author

Browsing by Author "Ren, P."

Filter results by typing the first few letters
Now showing 1 - 1 of 1
  • Results Per Page
  • Sort Options
  • Loading...
    Thumbnail Image
    Publication

    A single device based Voltage Step Stress (VSS) technique for fast reliability screening

    Ji, Z.
    ;
    Zhang, J. F.
    ;
    Zhang, W. D.
    ;
    Zhang, X.
    ;
    Kaczer, Ben  
    ;
    De Gendt, Stefan  
    ;
    Groeseneken, Guido  
    ;
    Ren, P.
    Proceedings paper
    2014, International Reliability Physics Symposium - IRPS, 1/06/2014, p.GD.2

Follow imec on

VimeoLinkedInFacebook

The repository

  • Contact us
  • Policy
  • About imec
Privacy statement | Cookie settings