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Browsing by Author "Riedel, W."

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    A life-cycle cost (LCC) fab model - interaction between activities in IC manufacturing and their supporting facilities within a fab

    Van Hoornick, Nausikaa  
    ;
    Van den Broeck, Kristel
    ;
    Van Hoeymissen, Jan
    ;
    Heyns, Marc  
    ;
    Riedel, W.
    Proceedings paper
    2004, Proceedings of the International Symposium on Semiconductor Manufacturing - ISSM, 27/09/2004, p.409-412

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