Browsing by Author "Riedel, Wolfgang"

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A life cycle cost (LCC) fab model: unique integration of IC manufacturing and facilities

Van Hoornick, Nausikaa
;
Riedel, Wolfgang
Oral presentation
2004, Semicon Europe
A life-cycle cost (LCC) fab model - interaction between activities in IC manufacturing and their supporting facilities within a fab

Van Hoornick, Nausikaa
;
Van den Broeck, Kristel
;
Van Hoeymissen, Jan
;
Heyns, Marc
Journal article
2004, Semiconductor Fabtech, 23, p.46-49