Browsing by Author "Rott, G."
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Publication Characterization and modeling of charge trapping: From single defects to devices
Proceedings paper2014, IEEE International Conference on IC Design & Technology - ICICDT, 28/05/2014, p.1-4Publication Physical modeling of NBTI: from individual defects to devices
Proceedings paper2014, International Conference on Simulation of Semiconductor Processes and Devices - SISPAD, 9/09/2014, p.81-84