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Browsing by Author "Roussel, P. J."

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    Publication

    Unified Analysis of Time-Dependent Dielectric Breakdown to Extend Reliability Margins

    Vici, Andrea  
    ;
    Pantisano, L.
    ;
    Roussel, P. J.
    ;
    Vaisman Chasin, Adrian  
    ;
    Franco, Jacopo  
    ;
    Kaczer, Ben  
    Journal article
    2025, IEEE TRANSACTIONS ON ELECTRON DEVICES, (72) 11, p.5780-5792

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