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Browsing by Author "Rouxhet, P. G."

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    New method to correct for the influence of organic contamination on intensity ratios in quantitative XPS

    Vereecke, Guy  
    ;
    Rouxhet, P. G.
    Journal article
    1999, Surface and Interface Analysis, (27) 8, p.761-769
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    Surface charging of insulating samples in x-ray photoelectron spectroscopy

    Vereecke, Guy  
    ;
    Rouxhet, P. G.
    Journal article
    1998, Surface and Interface Analysis, (26) 7, p.490-497

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