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Browsing by Author "Rutigliani, V. D."

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    Logic and memory patterning breakthrough using High-NA lithography

    Blanco, Victor  
    ;
    Roy, S.
    ;
    Chowrira, B.
    ;
    Pham, Van Tuong  
    ;
    Wouters, J.
    ;
    Das, S.
    ;
    Decoster, Stefan  
    Proceedings paper
    2024, 2024 Conference on Photomask Technology, 2024-09-29, p.1321604
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    Moore's Law meets High-NA EUV: Random via patterning for next-generation nodes

    Chowrira, B.
    ;
    Carballo, V. M. Blanco
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    Dusa, M.
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    Tan, L. E.
    ;
    Vats, H.
    ;
    Gillijns, W.
    ;
    Decoster, S.
    Proceedings paper
    2025, 2025 Conference on Optical and EUV Nanolithography, FEB 24-27, 2025

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