Browsing by Author "Saeys, Yvan"

A study on the calibration of fingerprint classifiers

An interactive ImageJ plugin for semi-automated image denoising in electron microscopy

An Introduction to Adversarially Robust Deep Learning

An overview of state-of-the-art image restoration in electron microscopy

Calibrated multi-probabilistic prediction as a defense against adversarial attacks

Convolutional neural network pruning to accelerate membrane segmentation in electron microscopy

Detecting adversarial examples with inductive Venn-ABERS predictors

Domain adaptive segmentation in volume electron microscopy imaging

IncGraph: Incremental graphlet counting for topology optimisation

Lower bounds on the robustness to adversarial perturbations

Regional image perturbation reduces Lp norms of adversarial examples while maintaining model-to-model transferability

SCIP: A scalable, reproducible, and open-source pipeline for morphological profiling image cytometry and microscopy data