Browsing by Author "Salm, C."
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Publication Correlation between hot carrier stress, oxide breakdown and gate leakage current for monitoring plasma processing induced damage on gate oxide
Proceedings paper2002, Proceedings of the 9th International Symposium on the Physical and Failure Analysis of Integrated Circuits - IPFA, 8/07/2002, p.242-245Publication Mechanical stress evolution and the Blech length: 2D simulation of early electromigration effects
Publication Mechanical stress evolution and the Blech length: 2D simulation of early electromigration effects