Browsing by Author "Schepers, K."
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Publication MTF test system with AC based dynamic joule correction for electromigration tests on interconnects
; ; ; Journal article2004, Microelectronics Reliability, (44) 9_11, p.1849-1854Publication MTF test system with AC based dynamic joule correction for electromigration tests on interconnects
; ; ; Proceedings paper2004, Proceedings of the 15th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis - ESREF, 4/10/2004, p.1849-1854