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Browsing by Author "Schepper, L."

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    In-situ SEM observation of electromigration in thin metal films at accelerated stress conditions

    D'Haen, Jan  
    ;
    Van Olmen, Jan  
    ;
    Beelen, Z.
    ;
    Manca, Jean
    ;
    Martens, T.
    ;
    De Ceuninck, Ward  
    Journal article
    2000, Microelectronics Reliability, (40) 8_10, p.1407-1412

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