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Browsing by Author "Schoukens, Johan"

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    Adaptive smoothing of frequency response functions in digital spectral analysers

    Antoni, Jerome
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    Schoukens, Johan
    Proceedings paper
    2007, Proceedings of the IEEE Instrumentation and Measurement Technology Conference - IMTC, 1/05/2007
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    Application of blind identification to nonlinear calibration

    Vanbeylen, Laurent
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    Pintelon, Rik
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    Schoukens, Johan
    Proceedings paper
    2007, Proceedings of the IEEE Instrumentation and Measurement Technology Conference - IMTC, 1/05/2007
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    Detection of unmodeled nonlinearities using correlation methods

    Enqvist, M.
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    Schoukens, Johan
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    Pintelon, Rik
    Proceedings paper
    2007, Proceedings of the IEEE Instrumentation and Measurement Technology Conference - IMTC, 1/05/2007
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    Enhanced time base jitter compensation of sine waves

    Verbeyst, Frans
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    Rolain, Yves
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    Pintelon, Rik
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    Schoukens, Johan
    Proceedings paper
    2007, Proceedings of the IEEE Instrumentation and Measurement Technology Conference - IMTC, 1/05/2007
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    Experimental characterization of operational amplifiers: a system identification approach - Part I: Theory and simulations

    Pintelon, Rik
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    Vandersteen, Gerd  
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    De Locht, Ludwig
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    Rolain, Yves
    ;
    Schoukens, Johan
    Journal article
    2004-06, IEEE Trans. Instrumentation and Measurement, (53) 3, p.854-862
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    Experimental characterization of operational amplifiers: a system identification approach - Part II: Calibration and measurements

    Pintelon, Rik
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    Rolain, Yves
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    Vandersteen, Gerd  
    ;
    Schoukens, Johan
    Journal article
    2004-06, IEEE Trans. Instrumentation and Measurement, (53) 3, p.863-876
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    Fast measurements of quantization distortions in DSP algorithms

    Paduart, Johan
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    Schoukens, Johan
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    Rolain, Yves
    Journal article
    2007, IEEE Trans. Instrumentation and Measurement, (56) 5, p.1917-1923
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    Frequency domain errors-in-variables estimation of linear dynamic systems using data from overlapping sub-records

    Barbé, Kurt
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    Schoukens, Johan
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    Pintelon, Rik
    Proceedings paper
    2007, Proceedings of the IEEE Instrumentation and Measurement Technology Conference - IMTC, 1/05/2007
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    Identification of a crystal detector using a block structres nonlinear feedback model

    Schoukens, Johan
    ;
    Gommé, Liesbeth
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    Van Moer, Wendy
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    Rolain, Yves
    Proceedings paper
    2007, Proceedings of the IEEE Instrumentation and Measurement Technology Conference - IMTC, 1/05/2007
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    Identifying the main nonlinear contributions: Use of multitone excitations during circuit design

    De Locht, Ludwig
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    Vandersteen, Gerd  
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    Wambacq, Piet  
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    Rolain, Yves
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    Pintelon, Rik
    ;
    Schoukens, Johan
    Proceedings paper
    2004-12, 64th ARFTG Microwave Measurement Conference, 30/11/2004, p.75-84
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    Identifying the structure of nonlinear perturbations in mixers using multisine signals

    Vandermot, Koen
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    Van Moer, Wendy
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    Rolain, Yves
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    Schoukens, Johan
    Journal article
    2007, IEEE Instrumentation and Measurement Magazine, (10) 5, p.32-39
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    Linearization of nonlinear dynamic systems

    Schoukens, Johan
    ;
    Németh, J.G.
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    Vandersteen, Gerd  
    ;
    Pintelon, Rik
    ;
    Crama, Philippe
    Journal article
    2004-08, IEEE Trans. Instrumentation and Measurement, (53) 4, p.1245-1248
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    Measuring the best linear approximation of a nonlinear system with uniformly frequency-distributed periodic signals

    Dobrowiecki, T.P.
    ;
    Schoukens, Johan
    Proceedings paper
    2007, Proceedings of the IEEE Instrumentation and Measurement Technology Conference - IMTC, 1/05/2007
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    Measuring the response of a voltage controlled oscillator using the large-signal network analyser

    Rolain, Yves
    ;
    Van Moer, Wendy
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    Pintelon, Rik
    ;
    Schoukens, Johan
    Proceedings paper
    2007, Proceedings of the IEEE Instrumentation and Measurement Technology Conference - IMTC, 1/05/2007
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    On the equivalence between some block oriented nonlinear models and nonlinear polynomial state space models

    Paduart, Johan
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    Schoukens, Johan
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    Gommé, Liesbeth
    Proceedings paper
    2007, Proceedings of the IEEE Instrumentation and Measurement Technology Conference - IMTC, 1/05/2007
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    Some practical applications of a nonlinear block structure identification procedure

    Lauwers, Lieve
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    Schoukens, Johan
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    Pintelon, Rik
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    Van Moer, Wendy
    ;
    Gommé, Liesbeth
    Proceedings paper
    2007, Proceedings of the IEEE Instrumentation and Measurement Technology Conference - IMTC, 1/05/2007
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    System identification approach applied to drift estimation

    Verbeyst, Farns
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    Pintelon, Rik
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    Rolain, Yves
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    Schoukens, Johan
    ;
    Clement, Tracy S.
    Proceedings paper
    2007, Proceedings of the IEEE Instrumentation and Measurement Technology Conference - IMTC, 1/05/2007
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    Using multisines to measure state-of-the-art analog to digital converters

    Rabijns, Daan
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    Van Moer, Wendy
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    Vandersteen, Gerd  
    ;
    Schoukens, Johan
    Proceedings paper
    2005-05, Proceedings of the IEEE Instrumentation and Measurement Technology Conference, 16/05/2005, p.7-12
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    Validation of a crystal detector model for the calibration of the large signal network analyzer

    Gommé, Liesbeth
    ;
    Schoukens, Johan
    ;
    Rolain, Yves
    ;
    Van Moer, Wendy
    Proceedings paper
    2007, Proceedings of the IEEE Instrumentation and Measurement Technology Conference - IMTC, 1/05/2007
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    Variance analysis of frequency response function measurements using periodic excitations

    D'haene, Tom
    ;
    Pintelon, Rik
    ;
    Schoukens, Johan
    ;
    Van Gheem, Els
    Journal article
    2005, IEEE Trans. Instrumentation and Measurement, (54) 4, p.1452-1456
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