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Browsing by Author "Schryvers, Nick"

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    Compositional characterization of nickel silicides by HAADF-STEM imaging

    Verleysen, Eveline
    ;
    Bender, Hugo  
    ;
    Richard, Olivier  
    ;
    Schryvers, Nick
    ;
    Vandervorst, Wilfried  
    Journal article
    2011, Journal of Materials Science, (46) 7, p.2001-2008
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    Epitaxial growth of hexagonal theta-nickel silicide on (001) Si

    Verleysen, Eveline
    ;
    Bender, Hugo  
    ;
    Richard, Olivier  
    ;
    Schryvers, Nick
    ;
    De Keyser, Koen
    Proceedings paper
    2010, International Microscopy Congress - IMC-17, 19/09/2010

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