Browsing by Author "Schwarz, Benedikt"
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Publication Reduction of the BTI time-dependent variability in nanoscaled MOSFETs by body bias
Proceedings paper2013, IEEE International Reliability Physics Symposium - IRPS, 14/04/2013, p.2D.3Publication The relevance of deeply-scaled FET threshold voltage shifts for operation lifetimes
Proceedings paper2012, IEEE International Reliability Physics Symposium - IRPS, 15/04/2012, p.5A.2.1-5A.2.6