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    Gated and STI defined ESD diodes in advanced bulk FinFET technologies

    Chen, Shih-Hung  
    ;
    Linten, Dimitri  
    ;
    Lee, J.-W.
    ;
    Scholz, Mirko
    ;
    Hellings, Geert  
    Proceedings paper
    2014, 2014 IEEE International Electron Devices Meeting - IEDM, 15/12/2014, p.514-517

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