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Browsing by Author "Selberherr, Siegfried"

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    Assessment of Electromigration in Nano-Interconnects

    Ceric, Hajdin
    ;
    Selberherr, Siegfried
    ;
    Zahedmanesh, Houman  
    ;
    de Orio, Roberto
    ;
    Croes, Kristof  
    Proceedings paper
    2019, 16th International Conference on Reliability and Stress-related Phenomena in Nano and Microelectronics - IRSP, 4/11/2019

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