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Browsing by Author "Senkader, S."

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    Measurement, modelling and simulation of defects in as-grown Czrochalski silicon

    Vanhellemont, Jan
    ;
    Senkader, S.
    ;
    Kissinger, G.
    ;
    Higgs, V.
    ;
    Trauwaert, Marie-Astrid
    ;
    Graef, D.
    Journal article
    1997, Journal of Crystal Growth, (180) 3_4, p.353-62
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    On the nature of grown-in defects in silicon: dependence on pulling conditions and evolution during treatments

    Vanhellemont, Jan
    ;
    Kissinger, G.
    ;
    Senkader, S.
    ;
    Gräf, D.
    ;
    Kenis, Karine  
    ;
    Depas, Michel
    ;
    Lambert, U.
    Proceedings paper
    1996, Proceedings of the 4th International Symposium on High Purity Silicon, 6/10/1996, p.226-237

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