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Browsing by Author "Shea, C."

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    Impact of EOT scaling down to 0.85nm on 70nm Ge-pFETs technology with STI

    Mitard, Jerome  
    ;
    Shea, C.
    ;
    De Jaeger, Brice  
    ;
    Pristera, Andrea
    ;
    Wang, Gang
    ;
    Houssa, Michel  
    Proceedings paper
    2009, Symposium on VLSI Technology, 15/06/2009, p.82-83

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