Browsing by Author "Shea, C."
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Publication Impact of EOT scaling down to 0.85nm on 70nm Ge-pFETs technology with STI
Proceedings paper2009, Symposium on VLSI Technology, 15/06/2009, p.82-83
Impact of EOT scaling down to 0.85nm on 70nm Ge-pFETs technology with STI