Browsing by Author "Shlyakhov, Ilya"
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Publication A sensitivity map-based approach to profile defects in MIM capacitors from I-V, C-V and G-V measurements
Journal article2019, IEEE Transactions on Electron Devices, (66) 4, p.1892-1998Publication Material-selective doping of 2D TMDC through AlxOy encapsulation
Journal article2019, ACS Applied Materials & Interfaces, (11) 45, p.42697-42707Publication Measurement of direct and indirect bandgaps in synthetic ultrathin MoS2 and WS2 films from photoconductivity spectra
Journal article2021, JOURNAL OF APPLIED PHYSICS, (129) 15, p.155302Publication Ovonic threshold switching GexSey chalcogenide materials: stoichiometry, trap nature and material relaxation from first principles
Journal article2020, Physica Status Solidi. Rapid Research Letters, (14) 5, p.1900672Publication Probing the role of substrate chemistry and interface interactions on MoS2
Meeting abstract2018, IEEE Semiconductor Interface Specialists Conference - SISC, 6/12/2018